Double Pulse Switching Test Board

Overview

The GeneSiC Double Pulse Test Board is designed for performing double

pulse switching tests on GeneSiCSiC Junction Transistors (SJT)as well

 as other three terminal switching transistors. It is designed using low ESL

capacitors and PCB traces to feature a low parasitic series inductance

 (LS) current path. This is necessary to record data which is most

 representative of the device undertest (DUT) and minimize testing circuit

distortions. The board is capable of reaching a maximum of

 1200 V and 100 A for high power device testing. An external load inductor,

 DUT, and free-wheeling diode (FWD) are soldered to the board without

sockets for the lowest possible contact resistance and inductance.

GeneSiC pin compatible gate drive boards may be mounted directly on

 to the Test Board for ease of use while also having a short, low inductance

path to the DUT gate pin connection.